liquid-metal ion source


liquid-metal ion source
жидкометаллический ионный источник

English-Russian dictionary on household appliances. 2014.

Смотреть что такое "liquid-metal ion source" в других словарях:

  • liquid-metal ion source — skystojo metalo jonų šaltinis statusas T sritis radioelektronika atitikmenys: angl. liquid metal ion source vok. Flüssigmetallionenquelle, f rus. жидкометаллический ионный источник, m pranc. source d ions à métal liquide, f …   Radioelektronikos terminų žodynas

  • Ion source — An ion source is an electro magnetic device that is used to create charged particles. These are used primarily within mass spectrometers or particle accelerators.Mass spectrometry In mass spectrometry, an ion source is a piece of equipment used… …   Wikipedia

  • DART ion source — A capsule being analyzed is held in the sample chamber between the DART ion source (right) and the spectrometer inlet (cone on left). DART (Direct Analysis in Real Time) is an atmospheric pressure ion source that instantaneously ionizes gases,… …   Wikipedia

  • source d'ions à métal liquide — skystojo metalo jonų šaltinis statusas T sritis radioelektronika atitikmenys: angl. liquid metal ion source vok. Flüssigmetallionenquelle, f rus. жидкометаллический ионный источник, m pranc. source d ions à métal liquide, f …   Radioelektronikos terminų žodynas

  • Ion thruster — An ion thruster is a form of electric propulsion used for spacecraft propulsion that creates thrust by accelerating ions. Ion thrusters are characterized by how they accelerate the ions, using either electrostatic or electromagnetic force.… …   Wikipedia

  • Ion — Cation and Anion redirect here. For the particle physics/quantum computing concept, see Anyon. For other uses, see Ion (disambiguation). Hydrogen atom (center) contains a single proton and a single electron. Removal of the electron gives a cation …   Wikipedia

  • Secondary ion mass spectrometry — Infobox chemical analysis name = Secondary ion mass spectrometry caption =CAMECA IMS3f Magnetic SIMS Instrument acronym = SIMS classification =Mass spectrometry analytes = Solid surfaces, thin films related = Fast atom bombardment… …   Wikipedia

  • Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… …   Wikipedia

  • Focused-Ion-Beam-Mikroskop — Foto eines FIB Arbeitsplatzes Ein Focused Ion Beam (Abk.: FIB; englisch für „fokussierter Ionenstrahl“) ist ein Gerät zur Oberflächenanalyse und bearbeitung. Steht der Materialabtrag im Vordergrund, heißt das Verfahren auch Ionendünnung. Wenn die …   Deutsch Wikipedia

  • Focused Ion Beam — Foto eines FIB Arbeitsplatzes Ein Focused Ion Beam (Abk.: FIB; englisch für „fokussierter Ionenstrahl“, deutsch auch Ionenfeinstrahlanlage) ist ein Gerät zur Oberflächenanalyse und bearbeitung. Steht der Materialabtrag im Vordergrund, heißt das… …   Deutsch Wikipedia

  • Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia


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